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Journal of Electron Spectroscopy and Related Phenomena

Volumn 144-147, Issue , 2005, Pages 881-884

Soft X-ray magnetic reflection spectroscopy at the 3p absorption edges of thin Fe films

(5) Hecker, M a Oppeneer, P M a Valencia, S b Mertins, H Ch b Schneider, C M c

a IFW DRESDEN (Germany)

b HAHN MEITNER INSTITUT (Germany)

c FORSCHUNGSZENTRUM JÜLICH (Germany)

Author keywords

Magnetic scattering; Resonant X ray scattering; T MOKE; XMLD

Indexed keywords

LIGHT ABSORPTION; LIGHT POLARIZATION; LIGHT REFLECTION; LIGHT SCATTERING; MAGNETIC HYSTERESIS; MAGNETIZATION; OPTICAL KERR EFFECT; SPECTROSCOPIC ANALYSIS; SPECTRUM ANALYSIS; THIN FILMS; X RAY ANALYSIS;

MAGNETIC SCATTERING; RESONANT X-RAY SCATTERING; TRANSVERSE MAGNETO-OPTICAL KERR EFFECT (T-MOKE); X-RAY MAGNETIC CIRCULAR DICHROISM (XMCD);

IRON;

EID: 17444394510 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2005.01.151 Document Type: Conference Paper

Times cited : (29)

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