Conductivity Measurement Using Four Linear Electrodes Embedded Inside a Rectangular Sample

Journal of the American Ceramic Society

Volumn 84, Issue 3-12, 2001, Pages 2895-2899

  Riess, Ilan ^a   Rutman, Jeremy ^a   Rosenstock, Zvi ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY; ELECTRIC CONDUCTORS; ELECTRIC CURRENTS;

ELECTROCERAMIC MATERIALS; ELECTRON HOLE DISTRIBUTION; ELECTRON HOLE PARTIAL CURRENT; ELECTRONIC CONDUCTIVITY; FOUR-ELECTRODE MEASUREMENTS; MIXED IONIC-ELECTRONIC CONDUCTOR;

ELECTRODES;

EID: 0041832333     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2001.tb01111.x     Document Type: Article

References (15)

1. See, for instance: I. Riess, "Method for Determining the Electrode Overpotential on Circular Samples," J. Appl. Phys., 71, 4079 (1992).
2. L. J. van der Pauw, "A Method of Measuring Specific Resistivity and Hall Effect of Discs of Arbitrary Shape," Philips Res. Rep., 13, 1 (1958).
3. L. B. Valdes, "Effect of Electrode Spacing on the Equivalent Base Resistance of Point-Contact Transistors," Proc. IRE, 40 1429 (1952); "Resistivity Measurements on Germanium for Transistors," ibid, 42, 420 (1954).
4. L. B. Valdes, "Effect of Electrode Spacing on the Equivalent Base Resistance of Point-Contact Transistors," Proc. IRE, 40 1429 (1952); "Resistivity Measurements on Germanium for Transistors," ibid, 42, 420 (1954).
5. A. Uhlir, "The Potentials of Infinite Systems of Sources and Numerical Solutions of Problems in Semiconductor Engineering," Bell Syst. Tech. J., 34 105 (1955).
6. E. B. Hansen, "On the Influence of Shape and Variations in Conductivity of the Sample on Four-Point Measurements," Appl. Sci. Res. B, 8 93 (1960).
7. A. Mircea, "The Geometric Factor in Semiconductor Four-Probe Resistivity Measurements," Solid State Electron., 6, 459 (1963).
8. A. E. Stephen, H. J. Mackey, and J. R. Sybert, "Effects of Contact Placement and Sample Shape in the Measurement of Electrical Resistivity," J. Appl. Phys., 42, 2592 (1971).
9. I. Riess, "Electrode Processes in Solid Oxide Fuel Cells" pp. 21-56 in NATO ASI Series, Series E: Applied Sciences, Vol. 368, Oxygen Ion and Mixed Conductors and Their Technological Applications. Edited by H. L. Tuller, J. Schoonman, and I. Riess, Kluwer Academic Publishers, New York, 2000.
10. R. V. Churchill, J. W. Brown, and R. F. Verhey, Complex Variables and Applications; pp. 195-238, 316, McGraw-Hill, New York, 1974.
11. L. Bieberbachs, Conformal Mapping; p. 111. Chelsea Publishing, New York, 1953.
12. I. Riess, "Four-Point Hebb Wagner Polarization Method for Determining the Electrical Conductivity in Mixed Ionic-Electronic Conductors," Solid State Ionics, 51, 219 (1992).
13. I. Riess, "What Does a Voltmeter Measure," Solid State Ionics, 95, 327 (1997).
14. I. Riess, "Electrochemistry of Mixed Ionic-Electronic Conductors"; pp. 223-68 in The CRC Handbook of Solid-State Electrochemistry. Edited by P. J. Gellings and H. J. M. Bouwmeester. CRC Press, Dordrecht, Netherlands, 1997.
15. I. Riess and D. S. Tannhauser, "Application of the van der Pauw Method to Conductivity Measurements of Mixed Ionic Electronic Conductors," Solid State Ionics, 7, 307 (1982).