Site preference of La in Bi3.75La0.25Ti 3O12 using neutron powder diffraction and Raman scattering

Journal of Electroceramics

Volumn 14, Issue 3, 2005, Pages 265-271

  Kim, Yong Il ^a,b   Nahm, Seung Hoon ^a   Yoon, Dong Jin ^a   Gregory, Duncan H ^b  

^a Korea Research Institute of Standards and Science   (South Korea)

^b UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

Bi3.75La0.25Ti 3O12; Ferroelectric material; Neutron powder scattering; Raman scttering; Structural refinement

Indexed keywords

ANODIC POLARIZATION; CRYSTAL STRUCTURE; ELECTRODES; FERROELECTRIC MATERIALS; LANTHANUM; LATTICE VIBRATIONS; NEUTRON DIFFRACTION; RAMAN SCATTERING; THIN FILMS;

BI3.75LAO.25TI3O12; MONOCLINIC SPACE GROUPS; NEURON POWDER SCATTERING; STRUCTURAL REFINEMENT;

BISMUTH COMPOUNDS;

EID: 17444393228     PISSN: 13853449     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10832-005-0966-3     Document Type: Article

References (17)

1. C.A. Paz de Araujo, J.D. Cuchiaro, L.D. McMillan, M.C. Scott, and J.F. Scott, Nature, 374, 627 (1995).
2. R. Raraesh, S. Aggarwal, and O. Auciello, Mat. Sci. Eng., 32, 191 (2001).
3. T. Kijima, M. Ushikubo, and H. Matsunaga, Jpn. J. Appl. Phys., 38, 127 (1999).
4. B.H. Park, B.S. Kang, S.D. Bu, T.W. Noh, J. Lee, and W. Jo, Nature, 401, 682 (1999).
5. U. Chon, G.C. Yi, and H.M. Jang, Appl. Phys. Lett., 78, 658 (2001).
6. A.C. Larson and R.B. Von Dreele, Los Alamos National Laboratory Report LAUR, 86-748 (1994).
7. L.W. Finger, D.E. Cox, and A.P. Jephcoat, J Appl. Cryst., 27, 892 (1994).
8. A.D. Rae, J.G. Thompson, R.L. Withers, and A.C. Willis, Acta Cryst., B46, 474 (1990).
9. C.H. Hervoches and P. Lightfoot, Chem. Mater., 11, 3359 (1999).
10. Y. Shimakawa, Y. Kubo, Y. Tauchi, S. Asano, T. Kamiyama, F. Izumi, and Z. Hiroi, Appl. Phys. Lett., 79, 2791 (2001).
11. Y.I. Kim, M.K. Jeon, and S.I. Woo, J. Mater. Sci. Lett., 22, 1655 (2003).
12. Y.I. Kim and M.K. Jeon, Mater. Lett., 58, 1889 (2004).
13. R.A. Young, The Rietveld Method (Oxford University Press, Oxford, 1993), Chap. 1.
14. M. Osada, M. Tada, M. Kakihana, T. Watanabe, and H. Funakubo, Jpn. J. Appl. Phys., 40, 5572 (2001).
15. M.S. Tomar, R.E. Melgarejo, A. Hidalgo, S.B. Mazumder, and R.S. Katiyar, J. Appl. Phys., 83, 341 (2003).
16. S. Kojima, R. Imaizumi, S. Hamazaki, and M. Takashige, Jpn. J. Appl. Phys., 33, 5559 (1994).
17. S. Kojima and S. Shimada, Physica B, 219-220, 617 (1996).