Precipitation of Ge nanoparticles from GeO2 glasses in transmission electron microscope

Applied Physics Letters

Volumn 86, Issue 14, 2005, Pages 1-3

  Jiang, Nan ^a   Qiu, Jianrong ^b   Spence, John C H ^c  

^a ARIZONA STATE UNIVERSITY   (United States)

^b SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DARK-FIELD IMAGES; DIELECTRIC MATRIX; SILICATE GLASSES; SURFACE CONTAMINATION;

ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC STRUCTURE; GERMANIUM COMPOUNDS; PHOTOLUMINESCENCE; PRECIPITATION (CHEMICAL); QUARTZ; SCANNING ELECTRON MICROSCOPY; SILICA; SURFACE PLASMON RESONANCE; TRANSMISSION ELECTRON MICROSCOPY;

NANOSTRUCTURED MATERIALS;

EID: 17444375993     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1898423     Document Type: Article

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