Structural matching for two-dimensional visual pattern inspection

Proceedings of the IEEE International Conference on Systems, Man and Cybernetics

Volumn 5, Issue , 1998, Pages 4429-4434

  Koo, Ja H ^a   Yoo, Suk I ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

INSPECTION; PRINTED CIRCUIT TESTING;

STRUCTURAL MATCHING; VISUAL PATTERN INSPECTION;

FEATURE EXTRACTION;

EID: 0032310208     PISSN: 08843627     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)