Phase and intensity control through diffractive optical elements in X-ray microscopy

Journal of Electron Spectroscopy and Related Phenomena

Volumn 144-147, Issue , 2005, Pages 957-961

  Fabrizio, Enzo Di ^a   Cojoc, Dan ^a   Cabrini, Stefano ^a   Altissimo, Matteo ^a,b   Kaulich, Burkhard ^c   Wilhein, Thomas ^d   Susini, Jean ^e   Dhez, Olivier ^e  

^a LABORATORIO TASC   (Italy)

^b POLITECNICO DI MILANO   (Italy)

^c SINCROTRONE TRIESTE   (Italy)

^d University for Applied Sciences   (Germany)

^e EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Beam shaping; Differential interference contrast microscopy; Diffractive optical elements; X ray microscopy

Indexed keywords

COMPUTER SIMULATION; IMAGING TECHNIQUES; MONOCHROMATORS; PHASE SHIFT; X RAY LITHOGRAPHY; X RAY MICROSCOPES; X RAY OPTICS; X RAYS;

BEAM SHAPING; DIFFERENTIAL INTERFERENCE CONTRAST MICROSCOPY; DIFFRACTIVE OPTICAL ELEMENTS (DOE); X-RAY MICROSCOPY;

DIFFRACTIVE OPTICS;

EID: 17444368324     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2005.01.262     Document Type: Conference Paper

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