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Volumn 68, Issue 16, 2003, Pages

Temperature and excitation energy dependence of decay processes of luminescence in Ge-Doped silica

Author keywords

[No Author keywords available]

Indexed keywords

GERMANIUM; SILICON DIOXIDE;

EID: 17344394321     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.68.165201     Document Type: Article
Times cited : (29)

References (31)
  • 3
    • 0003641685 scopus 로고    scopus 로고
    • edited by G. Pacchioni, L. Skuja, and D.L. Griscom (Kluwer Academic Publishers, Dordrecht
    • Defects in SiO2 and Related Dielectrics: Science and Technology, edited by G. Pacchioni, L. Skuja, and D.L. Griscom (Kluwer Academic Publishers, Dordrecht, 2000).
    • (2000) Defects in Sio2 and Related Dielectrics: Science and Technology
  • 29
    • 0004144017 scopus 로고    scopus 로고
    • edited by D.R. Vij (Plenum Press, New York
    • S. Shionoya, in Luminescence of Solids, edited by D.R. Vij (Plenum Press, New York, 1998), p. 95.
    • (1998) In Luminescence of Solids
    • Shionoya, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.