In situ FT-IR and photoluminescence study of porous silicon during exposure to F2, H2O, and D2O

Surface Science

Volumn 427-428, Issue , 1999, Pages 304-308

  Arigane, T ^a   Yoshida, K ^a   Wadayama, T ^a   Hatta, A ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; DEUTERIUM COMPOUNDS; FLUORINE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SURFACE CHEMISTRY; WATER;

INFRARED ABSORPTION SPECTROSCOPY; ISOTOPIC EXCHANGE; RAMAN SCATTERING SPECTROSCOPY;

POROUS SILICON;

EID: 17344383038     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00294-0     Document Type: Article

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