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Volumn 63-64, Issue , 1998, Pages 123-130
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Determination of the surface recombination velocity and of its evolution in monocrystalline silicon by the light beam induced current technique in planar configuration
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Author keywords
LBIC; Silicon; Surface Recombination
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Indexed keywords
ETCHING;
INDUCED CURRENTS;
PHOTOCURRENTS;
SURFACE PHENOMENA;
SURFACE PROPERTIES;
LIGHT BEAM INDUCED CURRENT (LBIC) METHODS;
SURFACE RECOMBINATION;
SILICON WAFERS;
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EID: 17344369555
PISSN: 10120394
EISSN: None
Source Type: Book Series
DOI: 10.4028/www.scientific.net/ssp.63-64.123 Document Type: Article |
Times cited : (3)
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References (14)
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