Evaluation of diffusion length from a planar-collector-geometry electron-beam-induced current profile

Journal of Applied Physics

Volumn 80, Issue 10, 1996, Pages 5775-5785

  Luke, Keung L ^a  

^a CALIFORNIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001413334     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363633     Document Type: Review

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