Spectroscopic ellipsometry characterization of ZnO-In2O 3 systems

Thin Solid Films

Volumn 455-456, Issue , 2004, Pages 384-387

  El Rhaleb, H ^a   En Naciri, A ^b   Dounia, R ^c   Johann, L ^b   Hakam, A ^a   Addou, M ^c  

^a MOHAMMED V UNIVERSITY   (Morocco)

^b 1 Boulevard Arago   (France)

^c IBN TOFAIL UNIVERSITY   (Morocco)

Author keywords

Drude Lorentz; Ellipsometry; Transport; ZnO In2O3 systems

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; ELLIPSOMETRY; GLASS; HEATING; PYROLYSIS; REFRACTIVE INDEX; SEMICONDUCTING INDIUM COMPOUNDS; SPECTROSCOPIC ANALYSIS; SYNTHESIS (CHEMICAL); ZINC OXIDE;

DRUDE/LORENTZ; ZNO-IN2O3 SYSTEMS;

THIN FILMS;

EID: 17144474445     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.01.061     Document Type: Conference Paper

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