VASE and IR spectroscopy: Excellent tools to study biaxial organic molecular thin films: DiMe-PTCDI on S-passivated GaAs(100)

Thin Solid Films

Volumn 455-456, Issue , 2004, Pages 586-590

  Friedrich, M ^a   Himcinschi, C ^a   Salvan, G ^a   Anghel, M ^a   Paraian, A ^a   Wagner, Th ^b   Kampen, T U ^a   Zahn, D R T ^a  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^b LOT Oriel GmbH   (Germany)

Author keywords

Anisotropy; Generalised ellipsometry; Infrared spectroscopy; Organic molecular thin film

Indexed keywords

ANISOTROPY; AROMATIC COMPOUNDS; DEPOSITION; DIELECTRIC PROPERTIES; ELLIPSOMETRY; FILM GROWTH; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LIGHT REFLECTION; MOLECULAR BEAMS; REFRACTIVE INDEX; SEMICONDUCTING GALLIUM ARSENIDE;

AZIMUTHAL ORIENTATION; ORGANIC MOLECULAR BEAM DEPOSITION; ORGANIC MOLECULAR THIN FILMS; SPECTROSCOPIC ELLIPSOMETRY;

THIN FILMS;

EID: 17144449214     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.11.224     Document Type: Conference Paper

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