Protein adsorption in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry

Thin Solid Films

Volumn 455-456, Issue , 2004, Pages 726-730

  Karlsson, L M ^a   Schubert, M ^b   Ashkenov, N ^b   Arwin, H ^a  

^a LINKÖPING UNIVERSITY   (Sweden)

^b UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

Porous silicon; Protein adsorption; Spatially resolved spectroscopic ellipsometry

Indexed keywords

ADSORPTION; ELECTROCHEMISTRY; ELLIPSOMETRY; ETCHING; POROUS SILICON; SILICON WAFERS; SPECTROSCOPIC ANALYSIS; SYNTHESIS (CHEMICAL);

PROTEIN ADSORPTION; SPATIALLY RESOLVED SPECTROSCOPIC ELLIPSOMETRY;

PROTEINS;

EID: 17144442672     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.01.062     Document Type: Conference Paper

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