Large-scale high-resolution scanning Hall probe microscope used for MgB2 filament characterization

Superconductor Science and Technology

Volumn 18, Issue 4, 2005, Pages 417-421

  Cambel, V ^a   Fedor, J ^a   Gregusova D ^a   Kovac P ^a   Husek I ^a  

^a INSTITUTE OF ELECTRICAL ENGINEERING   (Slovakia)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC LOSSES; GRAIN BOUNDARIES; HALL EFFECT; MAGNESIUM COMPOUNDS; MAGNETIC FIELDS; MICROSCOPIC EXAMINATION; SQUIDS;

COATED CONDUCTORS; CURRENT DISTRIBUTION; MAGNETIC FIELD DISTRIBUTION; SCANNING HALL PROBE MICROSCOPY (SHPM);

SUPERCONDUCTING MATERIALS;

EID: 17144383547     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/18/4/007     Document Type: Article

References (10)

1. Bending S J 1999 Adv. Phys. 48 449
2. de Lozanne A 1999 Supercond. Sci. Technol. 12 R43
3. Oral A, Bending S J and Henini M 1996 Appl. Phys. Lett. 69 1324
4. Gregory J K, Bending S J and Sandhu A 2002 Rev. Sci. Instrum. 73 3515
5. Fedor J, Cambel V, Gregušová D, Hanzelka P, Derer J and Volko J 2003 Rev. Sci. Instrum. 74 5105
6. Gregušovà D, Cambel V, Fedor J, Kúdela R, Šoltýs J, Lalinský T, Kostič I and Bending S J 2003 Appl. Phys. Lett. 82 3704
7. Perkins G K, Bugoslavsky Yu V, Qi X, MacManus-Driscoll L J and Caplin A D 2001 IEEE Trans. Appl. Supercond. 11 3186
8. Kováč P, Hušek I, Melišek I, Grovenor C R M and Haigh S 2004 Supercond. Sci. Technol. 17 1225
9. Bean C P 1962 Phys. Rev. Lett. 8 250
10. Fabbricatore P, Grace M, Musenich R, Kováč P, Hušek I and Gömöry F 2003 Supercond. Sci. Technol. 16 364