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Volumn 175-177, Issue , 2001, Pages 235-240
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Electrical isolation of n-type InP by ion bombardment: Dose dependence and thermal stability
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Author keywords
InP; Ion bombardment; Isolation; Sheet resistance; Thermal stability
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Indexed keywords
ANNEALING;
CARRIER CONCENTRATION;
CRYSTAL DEFECTS;
ION BOMBARDMENT;
PROTON IRRADIATION;
SEMICONDUCTING INDIUM PHOSPHIDE;
THERMODYNAMIC STABILITY;
ELECTRICAL ISOLATION;
SEMICONDUCTING FILMS;
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EID: 17044455388
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(00)00529-2 Document Type: Conference Paper |
Times cited : (9)
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References (19)
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