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Volumn 175-177, Issue , 2001, Pages 235-240

Electrical isolation of n-type InP by ion bombardment: Dose dependence and thermal stability

Author keywords

InP; Ion bombardment; Isolation; Sheet resistance; Thermal stability

Indexed keywords

ANNEALING; CARRIER CONCENTRATION; CRYSTAL DEFECTS; ION BOMBARDMENT; PROTON IRRADIATION; SEMICONDUCTING INDIUM PHOSPHIDE; THERMODYNAMIC STABILITY;

EID: 17044455388     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(00)00529-2     Document Type: Conference Paper
Times cited : (9)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.