Estimation of delay variations due to random-dopant fluctuations in nano-scaled CMOS circuits

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 2004, Pages 17-20

  Mahmoodi Meimand, Hamid ^a   Mukhopadhyay, Saibal ^a   Roy, Kaushik ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL EQUATIONS; INTEGRATION; LOGIC GATES; MATHEMATICAL MODELS; PARAMETER ESTIMATION; PROBABILITY DISTRIBUTIONS; STATISTICAL METHODS; THRESHOLD VOLTAGE; TRANSISTORS;

GATE DELAY MODELS; GAUSSIAN RANDOM VARIABLES; PROBABILITY DISTRIBUTION FUNCTION (PDF); RANDOM DOPANT FLUCTUATION (RDF);

CMOS INTEGRATED CIRCUITS;

EID: 17044438945     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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