Tensile test of a single nanofiber using an atomic force microscope tip

Applied Physics Letters

Volumn 86, Issue 7, 2005, Pages 1-3

  Tan, E P S ^a   Goh, C N ^a   Sow, C H ^a   Lim, C T ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE COUPLED DEVICES; ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE; FIBERS; OPTICAL MICROSCOPY; PIEZOELECTRICITY; POLYETHYLENE OXIDES; TENSILE TESTING;

CANTILEVER TIPS; ELECTROSPINNING; NANOFIBERS;

NANOSTRUCTURED MATERIALS;

EID: 17044397779     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1862337     Document Type: Article

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