Preparations and evaluations of C60 thin films for organic field-effect transistors

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 1 B, 2005, Pages 617-620

  Iwata, Nobuyuki ^a   Kinjo, Akane ^a   Okuyama, Hiroki ^a   Yamamoto, Hiroshi ^a  

^a NIHON UNIVERSITY   (Japan)

Author keywords

Atomic force microscopy (AFM); C60; Calcium fluoride (caF2); Epitaxial growth; FET; Mica; Molecular beam epitaxy (MBE); Organic; Si(111); Thin film

Indexed keywords

ATOMIC FORCE MICROSCOPY; EPITAXIAL GROWTH; FIELD EFFECT TRANSISTORS; MICA; MOLECULAR BEAM EPITAXY; SINGLE CRYSTALS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

C60; CALCIUM FLUORIDE (CAF2); ORGANIC; SI(111);

FULLERENES;

EID: 17044376697     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.44.617     Document Type: Conference Paper

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