Nanoscale device isolation of organic transistors via electron-beam lithography

Applied Physics Letters

Volumn 86, Issue 3, 2005, Pages 1-3

  Mattis, Brian A ^a   Pei, Yunan ^a   Subramanian, Vivek ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONTACTS; ELECTRON BEAM LITHOGRAPHY; LASER ABLATION; LEAKAGE CURRENTS; SEMICONDUCTING ORGANIC COMPOUNDS; SURFACE TREATMENT; THIN FILM TRANSISTORS;

CROSS-POINT ARRAYS; LINEWIDTHS; MOLECULAR ELECTRONICS; NANOSCALE ORGANIC CIRCUITS; PROXIMITY SCATTERING EFFECTS;

GATES (TRANSISTOR);

EID: 17044372356     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1854217     Document Type: Article

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