Fluorescence-based photoelectron features in Auger spectra

Surface and Interface Analysis

Volumn 29, Issue 9, 2000, Pages 602-607

  Zalm, P C ^a   Toussaint, S L G ^a   Crombeen, J E ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRON BEAMS; FLUORESCENCE; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; THIN FILMS; X RAYS;

OVERLAYERS;

SILICA;

EID: 0034273344     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200009)29:9<602::AID-SIA905>3.0.CO;2-W     Document Type: Article

References (16)

1. Hedberg CL. Handbook of Auger Electron Spectroscopy (3rd edn). Physical Electronics Inc.: Eden Prairie, 1995.
2. Seah MP. In Practical Surface Analysis, vol. 1, Briggs D, Seah MP (eds). Wiley: Chichester, 1991; 283-297.
3. Ferguson IF. Auger Microprobe Analysis. Adam Hilger for IOP Publishing Ltd.: Bristol, 1989.
4. Cazaux J, Moutou S. Surf. Interface Anal. 1984; 6: 62.
5. Hovland CT. Appl. Phys. Lett. 1977; 30: 274.
6. Reilman RF, Msezane A, Manson ST. J. Electron Spectrosc. 1976; 8: 389.
7. Henke BL, Lee P, Tanaka TJ, Shimabukuro RL, Fujikawa BK. At. Data Nucl. Data Tables 1982; 27: 1.
8. Scofield JH. J. Electron Spectrosc. 1976; 8: 129.
9. Ward RJ, Wood BJ. Surf. Interface Anal. 1992; 18: 679.
10. Tanuma S, Powell CJ, Penn DR. Surf. Interface Anal. 1991; 17: 911, 927; 1993; 20: 77; 1994; 21: 165.
11. Tanuma S, Powell CJ, Penn DR. Surf. Interface Anal. 1991; 17: 911, 927; 1993; 20: 77; 1994; 21: 165.
12. Tanuma S, Powell CJ, Penn DR. Surf. Interface Anal. 1991; 17: 911, 927; 1993; 20: 77; 1994; 21: 165.
13. Jablonski A, Powell CJ. J. Vac. Sci. Technol. 1997; A15: 2095.
14. Seah MP, Gilmore IS, Bishop HE, Lorang G. Surf. Interface Anal. 1998; 26: 701.
15. Reed SJB. Electron Microprobe Analysis (2nd edn). Cambridge University Press: Cambridge, 1993.
16. Feldman LC, Mayer JW. Fundamentals of Surface and Thin Film Analysis. Elsevier: New York, 1986; 181-212.