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Volumn 377, Issue 378, 2000, Pages 490-494
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Magnetron sputtering SiC films investigated by AFM
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
AUGER ELECTRON SPECTROSCOPY;
FILM PREPARATION;
MAGNETRON SPUTTERING;
PRESSURE EFFECTS;
SEMICONDUCTING SILICON;
SILICON CARBIDE;
SINTERING;
SUBSTRATES;
LATERAL FORCE MICROSCOPY;
AMORPHOUS FILMS;
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EID: 16744362755
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(00)01371-7 Document Type: Article |
Times cited : (30)
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References (11)
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