메뉴 건너뛰기




Volumn 377, Issue 378, 2000, Pages 490-494

Magnetron sputtering SiC films investigated by AFM

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; FILM PREPARATION; MAGNETRON SPUTTERING; PRESSURE EFFECTS; SEMICONDUCTING SILICON; SILICON CARBIDE; SINTERING; SUBSTRATES;

EID: 16744362755     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01371-7     Document Type: Article
Times cited : (30)

References (11)
  • 8
    • 0027666487 scopus 로고
    • Mate C.M. Wear. 168:1993;17.
    • (1993) Wear , vol.168 , pp. 17
    • Mate, C.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.