Optimization of off-null ellipsometry in sensor applications

Applied Optics

Volumn 43, Issue 10, 2004, Pages 2000-2005

  Wang, Guoliang ^a   Arwin, Hans ^a   Jansson, Roger ^a  

^a LINKÖPING UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL PROPERTIES; OPTICAL SENSORS; OPTIMIZATION; READOUT SYSTEMS; REFLECTOMETERS;

OFF NULL ELLIPSOMETRY; POLARIZER COMPENSATOR SAMPLE ANALYZER;

ELLIPSOMETRY;

EID: 16544369898     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.43.002000     Document Type: Article

References (10)

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