Analysis of electrical response of nematic liquid crystal by ellipsometry

Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals

Volumn 367, Issue , 2001, Pages 691-700

  Okutani, Satoshi ^a   Kimura, Munehiro ^a   Akahane, Tadashi ^a   Toriumi, Hirokazu ^b   Tadokoro, Toshiyasu ^c   Akao, Kenichi ^c  

^a NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c Hachioji shi   (Japan)

Author keywords

Anchoring strength; Ellipsometry; Flow effect; Interface; Total reflection

Indexed keywords

EID: 16444370095     PISSN: 1058725X     EISSN: None     Source Type: Journal    
DOI: 10.1080/10587250108028690     Document Type: Article

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