Analysis of liquid crystal orientation at interface between liquid crystal and alignment film by total reflection ellipsometry

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 37, Issue 5 B, 1998, Pages

  Okutani, S ^a   Kimura, M ^a   Akahane, T ^a  

^a NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; FILMS; INTERFACES (MATERIALS); LIGHT REFLECTION;

ANCHORING STRENGTH;

LIQUID CRYSTALS;

EID: 0032068831     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.l600     Document Type: Article

References (3)