|
Volumn 762, Issue , 2003, Pages 759-765
|
Anomalous behaviour of stain etched porous silicon photoluminescence
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CHEMICAL ATTACK;
CURRENT DENSITY;
ELECTROCHEMISTRY;
ELECTROLUMINESCENCE;
ETCHING;
OXIDATION;
POROUS SILICON;
SCANNING ELECTRON MICROSCOPY;
SILICON WAFERS;
STRAIN;
EMISSION ENERGY;
EXCITATION ENERGY;
PHOTOLUMINESCENCE SPECTRA;
PHOTOLUMINESCENCE;
|
EID: 1642581669
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-762-a17.16 Document Type: Conference Paper |
Times cited : (1)
|
References (16)
|