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Volumn 762, Issue , 2003, Pages 759-765

Anomalous behaviour of stain etched porous silicon photoluminescence

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ATTACK; CURRENT DENSITY; ELECTROCHEMISTRY; ELECTROLUMINESCENCE; ETCHING; OXIDATION; POROUS SILICON; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; STRAIN;

EID: 1642581669     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-762-a17.16     Document Type: Conference Paper
Times cited : (1)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.