메뉴 건너뛰기




Volumn 35, Issue 1, 2004, Pages 73-77

Micro-Raman spectroscopy of Si-, C-, Mg-and Be-implanted GaN layers

Author keywords

GaN epilayer; Ion implantation; Raman vibrational modes

Indexed keywords

ALUMINUM COMPOUNDS; BORON COMPOUNDS; III-V SEMICONDUCTORS; ION IMPLANTATION; MAGNESIUM COMPOUNDS; PHONONS; SILICON COMPOUNDS;

EID: 1642569254     PISSN: 03770486     EISSN: None     Source Type: Journal    
DOI: 10.1002/jrs.1108     Document Type: Article
Times cited : (17)

References (20)
  • 5
    • 0031150310 scopus 로고    scopus 로고
    • Zolper JC, J. Cryst. Growth 1997; 178: 157; Zolper JC, Tan HH, Williams JS, Zou J, Cockayne DJH, Pearton SJ, Crawford, MH, Karlicek RF Jr. Appl. Phys. Lett. 1997; 70: 2729.
    • (1997) J. Cryst. Growth , vol.178 , pp. 157
    • Zolper, J.C.1
  • 12
    • 0036670630 scopus 로고    scopus 로고
    • Kuball M. Surf. Interface Anal. 2001; 31: 987; Feng ZC. Opt. Eng. 2002; 41: 2022.
    • (2002) Opt. Eng. , vol.41 , pp. 2022
    • Feng, Z.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.