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Volumn 5130, Issue , 2003, Pages 51-57

UV Light with Oxygen treatment of Phase shift photoblank for Phase and Transmission control. Applicable to MxSi(1-x)O yN(y-1) type

Author keywords

[No Author keywords available]

Indexed keywords

AMMONIA; CLEANING; ETCHING; HYDROGEN PEROXIDE; INTAKE SYSTEMS; MOLYBDENUM COMPOUNDS; MONITORING; OXYGEN; PHASE SHIFT; TRANSPARENCY; ULTRAVIOLET RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 1642514830     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.504048     Document Type: Conference Paper
Times cited : (2)

References (8)
  • 1
    • 1642577674 scopus 로고    scopus 로고
    • Proc. of Photomask and X-Ray Mask technology
    • H. Handa, M. Takahashi, Y. Miynnahara, Proc. Of Photomask and X-Ray Mask technology, SPIE Vol.3096 pp-84-92.
    • SPIE , vol.3096 , pp. 84-92
    • Handa, H.1    Takahashi, M.2    Miynnahara, Y.3
  • 3
    • 1642496318 scopus 로고    scopus 로고
    • Part of the SPIE Conference on Photomask and X-Ray mask technology V
    • Y.Nagamura, H.Usui, N. Yoshioka, H. Moritomo, Part of the SPIE Conference on Photomask and X-Ray mask technology V, SPIE vol 3412 pp-395-404.
    • SPIE , vol.3412 , pp. 395-404
    • Nagamura, Y.1    Usui, H.2    Yoshioka, N.3    Moritomo, H.4
  • 4
    • 0033674795 scopus 로고    scopus 로고
    • Photomask and Next Generation Lithography mask technology VV
    • Y-S. Son, S-H. Jeong, J-B Kim, H-S. Kim, Photomask and Next Generation Lithography mask technology VV, Proceedings of SPIE, Vol. 4066 (2000), pp-416-423.
    • (2000) Proceedings of SPIE , vol.4066 , pp. 416-423
    • Son, Y.-S.1    Jeong, S.-H.2    Kim, J.-B.3    Kim, H.-S.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.