Morphological evolution of erbium disilicide nanowires on Si(001)

Surface and Interface Analysis

Volumn 36, Issue 2, 2004, Pages 104-108

  Yang, Jianshu ^a,b   Cai, Qun ^a   Wang, X D ^a   Koch, R ^b  

^a FUDAN UNIVERSITY   (China)

^b PDIF   (Germany)

Author keywords

Erbium; Nanowires; Scanning tunnelling microscopy; Si(001)

Indexed keywords

CRYSTAL LATTICES; CRYSTAL STRUCTURE; CRYSTALLIZATION; ERBIUM COMPOUNDS; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SILICON; X RAY DIFFRACTION ANALYSIS;

ERBIUM DISILICIDE; MORPHOLOGICAL EVOLUTION; NANOWIRES; STRUCTURAL TRANSFORMATION;

NANOSTRUCTURED MATERIALS;

EID: 1642338714     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1662     Document Type: Article

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