Magnetic force microscopy on cobalt nanocluster films

Applied Surface Science

Volumn 226, Issue 1-3 SPEC. ISS., 2004, Pages 185-190

  Koch, S A ^a   Te Velde, R H ^a   Palasantzas, G ^a   De Hosson, J Th M ^a  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

Magnetic correlation length; Magnetic force microscopy; Nanoclusters

Indexed keywords

AGGLOMERATION; ANISOTROPY; ATOMIC FORCE MICROSCOPY; CORRELATION METHODS; ELECTROSTATICS; FERROMAGNETIC MATERIALS; MAGNETIC FIELDS; NANOSTRUCTURED MATERIALS; SILICON; SURFACE PHENOMENA; THIN FILMS;

MAGNETIC CORRELATION LENGTH; MAGNETIC FORCE MICROSCOPY (MFM); NANOCLUSTERS;

COBALT;

EID: 1642293973     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2003.11.020     Document Type: Conference Paper

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