Structural properties of p+-type porous silicon layers versus the substrate orientation: An X-ray diffraction comparative study

Journal of Applied Crystallography

Volumn 32, Issue 6, 1999, Pages 1134-1144

  Faivre, C ^a   Bellet, D ^a,b  

^a LIPHY   (France)

^b UNIV GRENOBLE ALPES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 1642268206     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889899011103     Document Type: Article

References (21)

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