Uniform convergence of an exponentially fitted scheme for the quantum drift diffusion model

SIAM Journal on Numerical Analysis

Volumn 42, Issue 4, 2004, Pages 1648-1668

  Pinnau, René ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Exponential fitting; Generalized Scharfetter Gummel discretization; Mixed finite elements; Quantum drift diffusion; Semiclassical limit; Semiconductor; Uniform convergence

Indexed keywords

DIFFUSION; ERROR ANALYSIS; FINITE ELEMENT METHOD; MATHEMATICAL MODELS; QUANTUM THEORY; SEMICONDUCTOR MATERIALS;

EXPONENTIAL FITTING; GENERALIZED SCHARFETTER-GUMMEL DISCRETIZATION; MIXED FINITE ELEMENTS; QUANTUM DRIFT DIFFUSION; SEMICLASSICAL LIMIT; UNIFORM CONVERGENCE;

CONVERGENCE OF NUMERICAL METHODS;

EID: 15944396303     PISSN: 00361429     EISSN: None     Source Type: Journal    
DOI: 10.1137/S0036142903429961     Document Type: Article

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