Electrostatic patterning of a silica surface: A new model for charge build-up on a dielectric solid

Journal of Physical Chemistry B

Volumn 109, Issue 10, 2005, Pages 4631-4637

  Gouveia, Rubia F ^a   Costa, Carlos A R ^a   Galembeck, Fernando ^a  

^a UNIVERSITY OF CAMPINAS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE CARRIERS; CHEMISORPTION; ELECTRODES; ELECTROSTATICS; GOLD; LITHOGRAPHY; OXIDATION; POLARIZATION; SILICON WAFERS; THIN FILMS;

ELECTROSTATIC PATTERNING; SCANNING ELECTRIC POTENTIAL MICROSCOPY; SCANNING ELECTRIC POTENTIAL MICROSCOPY (SEPM); SILANOLS;

SILICA;

EID: 15944363035     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0457601     Document Type: Article

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