Valence electronic structure at the interface of organic thin films

Journal of Electron Spectroscopy and Related Phenomena

Volumn 78, Issue , 1996, Pages 387-390

  Sato, Naoki ^a   Yoshikawa, Masao ^b  

^a KYOTO UNIVERSITY   (Japan)

^b RICOH COMPANY LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000041266     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(96)80105-8     Document Type: Article

References (3)

1. M. Yoshikawa, et al., unpublished results.
2. T. Hirooka, K. Tanaka, K. Kuchitsu, M. Fujihira, H. Inokuchi and Y. Harada, Chem. Phys. Lett., 18 (1973) 390.
3. S. Yoshida, K. Kozawa, N. Sato and T. Uchida, Bull. Chem. Soc. Jpn., 67 (1994) 2017.