메뉴 건너뛰기




Volumn 275, Issue 1-2, 2005, Pages

New concept of criteria in epitaxial pairs

Author keywords

A1. X ray diffraction; A3. Atomic layer epitaxy; A3. Solid phase epitaxy; A3. Topotaxy

Indexed keywords

ADHESION; CRYSTAL GROWTH; CRYSTALLOGRAPHY; MAGNETITE; POLYCRYSTALLINE MATERIALS; X RAY DIFFRACTION;

EID: 15844429358     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.11.217     Document Type: Conference Paper
Times cited : (1)

References (18)
  • 9
    • 15844395609 scopus 로고
    • Powder diffraction and epitaxy
    • H. Morawiec, D. Stroz (Eds.) World Scientific, Singapore
    • J. Fiala, Powder diffraction and epitaxy, in: H. Morawiec, D. Stroz (Eds.), Applied Crystallography, World Scientific, Singapore, 1995, pp. 431-434.
    • (1995) Applied Crystallography , pp. 431-434
    • Fiala, J.1
  • 14
  • 16
    • 0003495856 scopus 로고    scopus 로고
    • set 1-51,70-89, International Centre for Diffraction Data Pennsylvania, USA
    • Powder Diffraction File 2, set 1-51,70-89, International Centre for Diffraction Data, www.icdd.com, Pennsylvania, USA, 2001
    • (2001) Powder Diffraction File , vol.2
  • 17
    • 15844388682 scopus 로고    scopus 로고
    • Paracrystallinity J. H. Morawiec D. Stroz World Scientific Singapore
    • J. Fiala Paracrystallinity H. Morawiec D. Stroz Applied Crystallography 1998 World Scientific Singapore 107 115
    • (1998) Applied Crystallography , pp. 107-115
    • Fiala, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.