Performance characterization of an InGaAs/InP single photon avalanche diode

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5543, Issue , 2004, Pages 100-111

  Morath, Christian P ^a   Vaccaro, Kenneth ^a   Clark, William R ^b   Teynor, William A ^c   Roland, Mark A ^c   Bailey, William ^c  

^a AIR FORCE RESEARCH LABORATORY   (United States)

^b OPTOGRATION INC   (United States)

^c SOLID STATE SCIENTIFIC CORPORATION   (United States)

Author keywords

Avalanche photodiode; Geiger mode; Photon counting; Single photon avalanche diodes; SPAD

Indexed keywords

AMPLIFIERS (ELECTRONIC); CHARACTERIZATION; GEIGER COUNTERS; IMPACT IONIZATION; PHOTOMULTIPLIERS; PHOTONS; PROBABILITY DISTRIBUTIONS; SEMICONDUCTING INDIUM COMPOUNDS; SENSITIVITY ANALYSIS; VOLTAGE CONTROL;

AVALANCHE PHOTODIODES (APD); PHOTON COUNTING; PHOTON DETECTION EFFICIENCY; SINGLE PHOTON AVALANCHE DIODES (SPAD);

AVALANCHE DIODES;

EID: 15844397963     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.562174     Document Type: Conference Paper

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