Secondary electron emission data of cesiated oxygen free high conductivity copper

Applied Surface Science

Volumn 150, Issue 1, 1999, Pages 1-7

  Hopman, H J ^a   Verhoeven, J ^a  

^a FOM INSTITUTE AMOLF   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; CESIUM; COPPER; DEPOSITION; ION BEAMS; ION SOURCES; MONOLAYERS;

OXYGEN FREE HIGH CONDUCTIVITY COPPER; SECONDARY ELECTRON EMISSION;

ELECTRON EMISSION;

EID: 0033321135     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00268-8     Document Type: Article

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