Determination of interface roughness of Gd films deposited on Si surface using improved wavelet transform of X-ray reflectivity data

Applied Surface Science

Volumn 244, Issue 1-4, 2005, Pages 235-239

  Starykov, Oleksiy ^a   Sakurai, Kenji ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Nanoparticles; Thin films; Wavelet transform; X ray reflectivity

Indexed keywords

COMPOSITION; DEPOSITION; GADOLINIUM; NANOSTRUCTURED MATERIALS; SILICON; SURFACE ROUGHNESS; WAVELET TRANSFORMS;

DIFFUSE LAYERS; FILM STRUCTURE; NANOPARTICLES; X-RAY REFLECTIVITY;

THIN FILMS;

EID: 15844393515     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.10.124     Document Type: Conference Paper

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