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Volumn 5540, Issue , 2004, Pages 196-205

Development of energy discriminated CdTe imaging detector for hard X-ray

Author keywords

CdTe Imaging detector; Energy discriminated

Indexed keywords

CADMIUM COMPOUNDS; CHARGE COUPLED DEVICES; ELECTRIC POTENTIAL; LEAKAGE CURRENTS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PHOTOMULTIPLIERS; RADIATION DETECTORS; TEMPERATURE CONTROL; X RAY ANALYSIS;

EID: 15844390612     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.559479     Document Type: Conference Paper
Times cited : (25)

References (10)
  • 3
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    • Surface processing of CdTe compound semiconductor by excimer laser doping
    • Y. Hatanaka, M. Niraula, Y. Aoki, T. Aoki, Y. Nakanishi, "Surface processing of CdTe compound semiconductor by excimer laser doping", Appl. Surf. Sci., 142, 233-236 (1999).
    • (1999) Appl. Surf. Sci. , vol.142 , pp. 233-236
    • Hatanaka, Y.1    Niraula, M.2    Aoki, Y.3    Aoki, T.4    Nakanishi, Y.5
  • 4
    • 15844381555 scopus 로고    scopus 로고
    • Determination of the melting threshold of CdTe crystal surface under irradiation with KrF excimer laser pulses
    • V. A. Gnatyuk, T. Aoki, Y. Hatanaka, "Determination of the melting threshold of CdTe crystal surface under irradiation with KrF excimer laser pulses",Prof. of JICAST2002, 229-232, (2002).
    • (2002) Prof. of JICAST , vol.2002 , pp. 229-232
    • Gnatyuk, V.A.1    Aoki, T.2    Hatanaka, Y.3
  • 5
    • 3342993132 scopus 로고    scopus 로고
    • P-i-n CdTe 128-pixel detector for gamma-ray imaging fabricated by excimer laser processing
    • T. Aoki, A. Nakamura, M. Niraula, Y. Tomita, Y. Hatanaka, "p-i-n CdTe 128-pixel detector for gamma-ray imaging fabricated by excimer laser processing", Proc of SPIE, 4784, 259-268 (2002).
    • (2002) Proc of SPIE , vol.4784 , pp. 259-268
    • Aoki, T.1    Nakamura, A.2    Niraula, M.3    Tomita, Y.4    Hatanaka, Y.5
  • 6
    • 0001026156 scopus 로고    scopus 로고
    • ZnO diode fabricated by excimer-laser doping
    • T. Aoki, Y. Hatanaka and D. C. Look, "ZnO diode fabricated by excimer-laser doping," Appl. Phys. Lett., 76, pp.3257-3258, 2000.
    • (2000) Appl. Phys. Lett. , vol.76 , pp. 3257-3258
    • Aoki, T.1    Hatanaka, Y.2    Look, D.C.3
  • 7
    • 18244417949 scopus 로고    scopus 로고
    • Excimer laser doping techniques for II-VI semiconductors
    • Y. Hatanaka, M. Niraula, A. Nakamura, and T. Aoki, "Excimer laser doping techniques for II-VI semiconductors," Appl. Surf. Sci., 175-176, pp.462-467, 2001.
    • (2001) Appl. Surf. Sci. , vol.175-176 , pp. 462-467
    • Hatanaka, Y.1    Niraula, M.2    Nakamura, A.3    Aoki, T.4
  • 9
    • 0036002044 scopus 로고    scopus 로고
    • A new fabrication technique of CdTe strip detectors for gamma-ray imaging and spectroscopy
    • M. Niraula, A. Nakamura, T. Aoki, Y. Tomita, Y. Hatanaka, "A new fabrication technique of CdTe strip detectors for gamma-ray imaging and spectroscopy," Phys. Stat. Sol. (b), 229, pp.1103-1107, 2002.
    • (2002) Phys. Stat. Sol. (b) , vol.229 , pp. 1103-1107
    • Niraula, M.1    Nakamura, A.2    Aoki, T.3    Tomita, Y.4    Hatanaka, Y.5
  • 10
    • 0035415627 scopus 로고    scopus 로고
    • Shallow junction formation on p-like CdTe crystals by indium diffusion using excimer laser annealing
    • M. Niraula, A. Nakamura, T. Aoki, H. Tatsuoka, and Y. Hatanaka, "Shallow junction formation on p-like CdTe crystals by indium diffusion using excimer laser annealing,", J. of Electron. Mater., 30, pp.911-916, 2001.
    • (2001) J. of Electron. Mater. , vol.30 , pp. 911-916
    • Niraula, M.1    Nakamura, A.2    Aoki, T.3    Tatsuoka, H.4    Hatanaka, Y.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.