-
1
-
-
0033907602
-
Absolute shape measurements using high-resolution optoelectronic holography methods
-
C. Furlong and R. J. Pryputniewicz, "Absolute shape measurements using high-resolution optoelectronic holography methods," Opt. Eng., 39(1):216-223, 2000.
-
(2000)
Opt. Eng.
, vol.39
, Issue.1
, pp. 216-223
-
-
Furlong, C.1
Pryputniewicz, R.J.2
-
2
-
-
0036421051
-
Sensitivity, accuracy, and precision issues in optoelectronic holography based on fiber optics and high-spatial and high-digital resolution cameras
-
C. Furlong, J. S. Yokum, and R. J. Pryputniewicz, "Sensitivity, accuracy, and precision issues in optoelectronic holography based on fiber optics and high-spatial and high-digital resolution cameras," Proc. SPIE, 4777:77-84, 2002.
-
(2002)
Proc. SPIE
, vol.4777
, pp. 77-84
-
-
Furlong, C.1
Yokum, J.S.2
Pryputniewicz, R.J.3
-
3
-
-
0008600841
-
An electro-optic holography system with real-time arithmetic processing
-
K. A. Stetson, W. R. Brohinsky, J. Wahid, and T. Bushman, "An electro-optic holography system with real-time arithmetic processing," J. Nondestruct. Eval., 8:69-75, 1989.
-
(1989)
J. Nondestruct. Eval.
, vol.8
, pp. 69-75
-
-
Stetson, K.A.1
Brohinsky, W.R.2
Wahid, J.3
Bushman, T.4
-
4
-
-
84958485869
-
Measurement of vibration patterns using electro-optic holography
-
R. J. Pryputniewicz and K. A. Stetson, "Measurement of vibration patterns using electro-optic holography," Proc. SPIE, 1162:456-467, 1989.
-
(1989)
Proc. SPIE
, vol.1162
, pp. 456-467
-
-
Pryputniewicz, R.J.1
Stetson, K.A.2
-
5
-
-
0011926066
-
Quantitative determination of displacements and strains from holograms
-
Ch. 3 in P. K. Rastogi, ed., Springer-Verlag, Berlin
-
R. J. Pryputniewicz, "Quantitative determination of displacements and strains from holograms," Ch. 3 in P. K. Rastogi, ed., Holographic interferometry, Springer-Verlag, Berlin, pp. 33-72, 1994.
-
(1994)
Holographic Interferometry
, pp. 33-72
-
-
Pryputniewicz, R.J.1
-
6
-
-
0002968604
-
Opto-mechanical study and optimization of a cantilever plate dynamics
-
C. Furlong and R. J. Pryputniewicz, "Opto-mechanical study and optimization of a cantilever plate dynamics," Proc. SPIE, 2545:192-203, 1995.
-
(1995)
Proc. SPIE
, vol.2545
, pp. 192-203
-
-
Furlong, C.1
Pryputniewicz, R.J.2
-
7
-
-
0001673069
-
Hybrid computational and experimental approach for the study and optimization of mechanical components
-
C. Furlong and R. J. Pryputniewicz, "Hybrid computational and experimental approach for the study and optimization of mechanical components," Opt. Eng., 37(5): 1448-1455, 1998.
-
(1998)
Opt. Eng.
, vol.37
, Issue.5
, pp. 1448-1455
-
-
Furlong, C.1
Pryputniewicz, R.J.2
-
8
-
-
0000270342
-
Holographic microscope for measuring displacements of vibrating microbeams using time-average electro-optic holography
-
G. C. Brown and R. J. Pryputniewicz, "Holographic microscope for measuring displacements of vibrating microbeams using time-average electro-optic holography," Opt. Eng., 37(2): 1398-1405, 1998.
-
(1998)
Opt. Eng.
, vol.37
, Issue.2
, pp. 1398-1405
-
-
Brown, G.C.1
Pryputniewicz, R.J.2
-
9
-
-
0038380737
-
Optoelectronic characterization of shape and deformation of MEMS accelerometers used in transportation applications
-
C. Furlong and R. J. Pryputniewicz, "Optoelectronic characterization of shape and deformation of MEMS accelerometers used in transportation applications," Opt. Eng., 42(2):1223-1231, 2003.
-
(2003)
Opt. Eng.
, vol.42
, Issue.2
, pp. 1223-1231
-
-
Furlong, C.1
Pryputniewicz, R.J.2
-
10
-
-
15744364076
-
Sloan DekTak calibration standards set
-
Tucson, AZ
-
Veeco Instruments, "Sloan DekTak calibration standards set," Veeco Metrology Group, Tucson, AZ, 2002.
-
(2002)
Veeco Metrology Group
-
-
-
11
-
-
0035240881
-
CCD vs. CMOS: Facts and fiction
-
Jan
-
D. Litwiller, "CCD vs. CMOS: facts and fiction," Photonics Spectra, pp. 154-158, Jan 2001.
-
(2001)
Photonics Spectra
, pp. 154-158
-
-
Litwiller, D.1
-
12
-
-
0038277894
-
Duelling detectors
-
Feb
-
J. Janesick, "Duelling detectors," OE Magazine, pp.30-33, Feb 2002.
-
(2002)
OE Magazine
, pp. 30-33
-
-
Janesick, J.1
-
13
-
-
15744390646
-
-
Waterloo, Notario, Canada
-
Dalsa, Corp., http://www.dalsa.com, Waterloo, Notario, Canada, 2004.
-
(2004)
-
-
-
14
-
-
15744398793
-
-
Costa Mesa, CA
-
Silicon Imaging, Inc., http://www.siliconimaging.com, Costa Mesa, CA, 2004.
-
(2004)
-
-
-
15
-
-
0004046277
-
-
SDRC Imageware, Ann Arbor, MI
-
Verdict user's guide v8.0, SDRC Imageware, Ann Arbor, MI, 1998.
-
(1998)
Verdict User's Guide V8.0
-
-
-
16
-
-
15744395728
-
-
Innovmetric Software Inc., Sainte-Foy, Quebec, Canada
-
Polyworks user's guide v7.0, Innovmetric Software Inc., Sainte-Foy, Quebec, Canada, 2004.
-
(2004)
Polyworks User's Guide V7.0
-
-
-
17
-
-
15744396682
-
-
Parametric Technology Corporation, Waltham, MA
-
Pro/Scan-Tools. User's guide v. 2000i2, Parametric Technology Corporation, Waltham, MA, 2000.
-
(2000)
Pro/Scan-tools. User's Guide V. 2000i2
-
-
-
19
-
-
15744362152
-
-
Norwood, MA
-
Analog Devices, Inc., http://www.analog.com, Norwood, MA, 2004.
-
(2004)
-
-
-
20
-
-
84885255983
-
ADXL202 / ADXL210 - Low cost ±2 g / ±10 g dual axis iMEMS® accelerometers with digital output
-
Analog Devices, Inc., Norwood, MA
-
Application Note, "ADXL202 / ADXL210 - low cost ±2 g / ±10 g dual axis iMEMS® accelerometers with digital output", Analog Devices, Inc., Norwood, MA, 2004.
-
(2004)
Application Note
-
-
-
21
-
-
2942647604
-
-
MS Thesis, Worcester Polytechnic Institute, Worcester, MA
-
R. Kok, Application of MEMS accelerometers to modal analysis of structures, MS Thesis, Worcester Polytechnic Institute, Worcester, MA, 2004.
-
(2004)
Application of MEMS Accelerometers to Modal Analysis of Structures
-
-
Kok, R.1
-
22
-
-
15744396442
-
Confocal optoelectronic holography microscope for structural characterization and optimization of MEMS
-
Boston, MA
-
C. Furlong, A. M. Siegel, P. Hefti, and R. J. Pryputniewicz, "Confocal optoelectronic holography microscope for structural characterization and optimization of MEMS," Transducers'03, pp.420-423, Boston, MA, 2003.
-
(2003)
Transducers'03
, pp. 420-423
-
-
Furlong, C.1
Siegel, A.M.2
Hefti, P.3
Pryputniewicz, R.J.4
-
23
-
-
33745865925
-
Inspection of micro-optical components by novel digital holographic techniques
-
Costa Mesa, CA
-
E. Kolenovic, C. Furlong, and W. Jüptner, "Inspection of micro-optical components by novel digital holographic techniques," Proc. SEM Internat. Congress and Exposition, Costa Mesa, CA, 2004.
-
(2004)
Proc. SEM Internat. Congress and Exposition
-
-
Kolenovic, E.1
Furlong, C.2
Jüptner, W.3
-
25
-
-
0000981730
-
Improved three-dimensional imaging with a digital holography microscope with a source of partial spatial coherence
-
F. Dubois, L. Joannes, J.-C. Legros, "Improved three-dimensional imaging with a digital holography microscope with a source of partial spatial coherence", Applied Optics, 38(34):7085-7094, 1999.
-
(1999)
Applied Optics
, vol.38
, Issue.34
, pp. 7085-7094
-
-
Dubois, F.1
Joannes, L.2
Legros, J.-C.3
-
26
-
-
2142811512
-
Trends in 300 mm wafers: Factory automation
-
R. Hunter and C. Humphreys, "Trends in 300 mm wafers: factory automation," Semicon. Int., 26(6), pp. 60-64, 2003.
-
(2003)
Semicon. Int.
, vol.26
, Issue.6
, pp. 60-64
-
-
Hunter, R.1
Humphreys, C.2
-
27
-
-
2142660322
-
New optoelectronic methodology for nondestructive evaluation of MEMS at the wafer level
-
in-press
-
C. Furlong, C. F. Ferguson, and M. J. Melson, "New optoelectronic methodology for nondestructive evaluation of MEMS at the wafer level," in-press, Proc. SPIE, 5265:000-000, 2003.
-
(2003)
Proc. SPIE
, vol.5265
-
-
Furlong, C.1
Ferguson, C.F.2
Melson, M.J.3
|