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Volumn 39, Issue 1, 2000, Pages 216-223
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Absolute shape measurements using high-resolution optoelectronic holography methods
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Author keywords
[No Author keywords available]
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Indexed keywords
ALGORITHMS;
COMPUTER AIDED DESIGN;
COMPUTER AIDED ENGINEERING;
FIBER OPTICS;
LIGHTING;
MATHEMATICAL MODELS;
OPTICAL CORRELATION;
OPTIMIZATION;
OPTOELECTRONIC DEVICES;
SPECKLE;
HIGH-RESOLUTION OPTOELECTRONIC HOLOGRAPHY (OEH);
SHAPE MEASUREMENT;
HOLOGRAPHY;
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EID: 0033907602
PISSN: 00913286
EISSN: None
Source Type: Journal
DOI: 10.1117/1.602355 Document Type: Article |
Times cited : (57)
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References (10)
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