Fabrication and characterization of scanning tunneling microscopy superconducting Nb tips having highly enhanced critical fields

Physica C: Superconductivity and its Applications

Volumn 419, Issue 1-2, 2005, Pages 18-24

  Kohen, A ^a   Noat, Y ^a   Proslier, T ^a   Lacaze, E ^a   Aprili, M ^b   Sacks, W ^a   Roditchev, D ^a  

^a INSTITUT DES NANOSCIENCES DE PARIS   (France)

^b Lab de Spectrosc en Lumiere P   (France)

Author keywords

Critical field; Scanning tunneling microscopy; Superconducting tip

Indexed keywords

ELECTRIC INSULATORS; ELECTRIC POTENTIAL; FABRICATION; MAGNETIC FIELD EFFECTS; MECHANICAL PROPERTIES; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPY; SUPERCONDUCTING DEVICES; SUPERCONDUCTING MATERIALS; SURFACE TOPOGRAPHY; THERMAL EFFECTS;

CRITICAL FIELDS; DENSITY OF ELECTRONIC STATES (DOS); SCANNING TUNNELING SPECTROSCOPY (STS); SUPERCONDUCTING TIPS;

NIOBIUM;

EID: 15744396134     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2004.12.001     Document Type: Article

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