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Volumn 64, Issue 21, 2001, Pages 2125061-2125064
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Josephson scanning tunneling microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ARTICLE;
CONDUCTANCE;
ENERGY;
MAGNETIC FIELD;
MATHEMATICAL ANALYSIS;
MEASUREMENT;
MICROSCOPY;
SCANNING TUNNELING MICROSCOPY;
TEMPERATURE;
THEORY;
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EID: 0035578110
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (47)
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References (21)
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