Modeling and analysis of correlated software failures of multiple types

IEEE Transactions on Reliability

Volumn 54, Issue 1, 2005, Pages 100-106

  Dai, Yuan Shun ^a   Xie, Min ^b   Poh, Kim Leng ^b  

^a INDIANA UNIVERSITY   (United States)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Dependent software runs; Failure category; Failure correlation; Markov renewal process; Multiple failure types; Software reliability

Indexed keywords

COMPUTER SOFTWARE; CORRELATION METHODS; FAILURE ANALYSIS; MARKOV PROCESSES; MATHEMATICAL MODELS; PROBABILITY DISTRIBUTIONS;

DEPENDENT SOFTWARE RUNS; FAILURE CATEGORY; FAILURE CORRELATION; MARKOV RENEWAL PROCESS; MULTIPLE FAILURE TYPES; SOFTWARE RELIABILITY;

RELIABILITY THEORY;

EID: 15544381240     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2004.841709     Document Type: Article

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