An imperfect debugging model with two types of hazard rates for software reliability measurement and assessment

Mathematical and Computer Modelling

Volumn 31, Issue 10-12, 2000, Pages 343-352

  Tokuno, K ^a   Yamada, S ^a  

^a TOTTORI UNIVERSITY   (Japan)

Author keywords

Hazard rates; Imperfect debugging; Latent faults; Markov process; Regenerated random faults; Software reliability

Indexed keywords

EID: 0034701855     PISSN: 08957177     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0895-7177(00)00105-9     Document Type: Article

References (11)

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