Direct measurement of surface complex loading and surface dipole and their effect on simple device behavior

Journal of Physical Chemistry B

Volumn 109, Issue 9, 2005, Pages 3966-3970

  Guo, Jing ^a   Koch, Norbert ^b   Schwartz, Jeffrey ^a   Bernasek, Steven L ^a  

^a PRINCETON UNIVERSITY   (United States)

^b HUMBOLDT UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INDIUM-TIN OXIDE (ITO); QUARTZ CRYSTALS; SURFACE COMPLEXES; SURFACE SILANIZATION;

COMPLEXATION; CRYSTALS; CURRENT DENSITY; DEPOSITION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INDIUM COMPOUNDS; INFRARED SPECTROSCOPY; QUARTZ; SUBSTRATES; ULTRAHIGH VACUUM;

SURFACE CHEMISTRY;

EID: 15544378964     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp046337v     Document Type: Article

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