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Volumn 42, Issue 2-4, 2002, Pages 439-446

Planning accelerated life tests with three constant stress levels

Author keywords

Accelerated life testing; Multiple stress levels; Weibull distribution

Indexed keywords

OPTIMIZATION; PROBABILITY; STATISTICAL TESTS; WEIBULL DISTRIBUTION;

EID: 0037061495     PISSN: 03608352     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0360-8352(02)00040-2     Document Type: Conference Paper
Times cited : (19)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.