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Volumn 42, Issue 2-4, 2002, Pages 439-446
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Planning accelerated life tests with three constant stress levels
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Author keywords
Accelerated life testing; Multiple stress levels; Weibull distribution
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Indexed keywords
OPTIMIZATION;
PROBABILITY;
STATISTICAL TESTS;
WEIBULL DISTRIBUTION;
ACCELERATED LIFE TESTING (ALT);
STRESS ANALYSIS;
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EID: 0037061495
PISSN: 03608352
EISSN: None
Source Type: Journal
DOI: 10.1016/S0360-8352(02)00040-2 Document Type: Conference Paper |
Times cited : (19)
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References (9)
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