Planning accelerated life tests with three constant stress levels

Computers and Industrial Engineering

Volumn 42, Issue 2-4, 2002, Pages 439-446

  Tang, Loon Ching ^a   Tan, Aik Peng ^a   Ong, Soon Huat ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b National Semiconductor   (Singapore)

Author keywords

Accelerated life testing; Multiple stress levels; Weibull distribution

Indexed keywords

OPTIMIZATION; PROBABILITY; STATISTICAL TESTS; WEIBULL DISTRIBUTION;

ACCELERATED LIFE TESTING (ALT);

STRESS ANALYSIS;

EID: 0037061495     PISSN: 03608352     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0360-8352(02)00040-2     Document Type: Conference Paper

References (9)

1. Minimizing maximum stress of accelerated life tests
2. Optimal accelerated life designs for estimation
3. How to plan accelerated life tests: Some practical guidelines
4. Optimum censored accelerated life tests for Weibull and extreme value distributions
5. Optimum acceleration life tests with a non-constant scale parameter
6. Theory for optimum censored accelerated life tests for normal and lognormal life distributions
7. Theory for optimum accelerated life tests for Weibull and extreme value distributions
8. Optimum constant-stress accelerated life-test plans
9. Best compromise test plans for Weibull distributions with different censoring times