Goodness-of-fit tests for parametric regression models

Journal of the American Statistical Association

Volumn 96, Issue 454, 2001, Pages 640-652

  Fan, Jianqing ^a,b   Huang, Li Shan ^c  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^b University of North Carolina at Chapel Hill   (United States)

^c UNIVERSITY OF ROCHESTER MEDICAL CENTER   (United States)

Author keywords

Adaptive Neyman test; Contiguous alternatives; Partial linear model; Power; Wavelet thresholding

Indexed keywords

EID: 1542678352     PISSN: 01621459     EISSN: 1537274X     Source Type: Journal    
DOI: 10.1198/016214501753168316     Document Type: Article

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