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Volumn 24, Issue 5, 1996, Pages 1982-2019

Asymptotic optimality of data-driven Neyman's tests for uniformity

Author keywords

Efficiency; Exponential family; Goodness of fit; Large deviations; Log density estimation; Minimum relative entropy estimation; Schwarz's criterion; Smooth test

Indexed keywords


EID: 0030363428     PISSN: 00905364     EISSN: None     Source Type: Journal    
DOI: 10.1214/aos/1069362306     Document Type: Article
Times cited : (71)

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