Electron energy loss-near edge structure as a fingerprint for identifying chromium nitrides

Solid State Communications

Volumn 130, Issue 3-4, 2004, Pages 209-213

  Mitterbauer, C ^a   Hebert C ^b   Kothleitner, G ^a   Hofer, F ^a   Schattschneider, P ^b   Zandbergen, H W ^c  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^c DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

A. Chromium nitride; C. Scanning and transmission electron microscopy; E. Electron energy loss spectroscopy

Indexed keywords

ANTIFERROMAGNETISM; BAND STRUCTURE; CRYSTALLOGRAPHY; ELECTRON ENERGY LOSS SPECTROSCOPY; NEUTRON DIFFRACTION; TRANSMISSION ELECTRON MICROSCOPY;

CHROMIUM NITRIDE; CRYSTALLOGRAPHIC STRUCTURES;

CHROMIUM COMPOUNDS;

EID: 1542505701     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2004.01.045     Document Type: Article

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