Effect of Ta and Ta/Cu buffers on the exchange bias field of NiFe/FeMn bilayers

Wuli Xuebao/Acta Physica Sinica

Volumn 50, Issue 11, 2001, Pages 2233-2234

  Li, Ming Hua ^a,b   Yu, Guang Hua ^b   Jiang, Hong Wei ^c   Cai, Jian Wang ^a   Zhu, Feng Wu ^b  

^a INSTITUTE OF PHYSICS   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

^c CAPITAL NORMAL UNIVERSITY   (China)

Author keywords

Exchange bias field; NiFe FeMn; Surface roughness; Texture

Indexed keywords

EID: 1542466717     PISSN: 10003290     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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